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Project Leader, Polymer Membranes and Transport Media
National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, USA
Education:
2001 PhD University of Massachusetts Amherst
1996 BS University of Southern Mississippi
Awards:
U.S. Department of Commerce Silver Medal Award (2005)
Fellow of the American Physical Society (2017)
Fellow of the ACS PMSE Division (2018)
Research Interests:
Polymer thin films and membranes; Thin film mechanics; Surface wrinkling and patterning
Selected Papers (For more see the link Dr. Christopher M. Stafford):
Stafford, C.M., Harrison, C., Beers, K.L., Karim, A., Amis, E.J., Vanlandingham, M.R., Kim, H.-C., Volksen, W., Miller, R.D., Simonyi, E.E., 2004. A buckling-based metrology for measuring the elastic moduli of polymeric thin films. Nat. Mater. 3, 545–550.
C. Harrison, C. M. Stafford, W. Zhang and A. Karim, Sinusoidal phase grating created by a tunably buckled surface, Appl. Phys. Lett., 2004, 85, 4016–4018
Stafford, C. M., Guo, S., Chiang, M. Y. M., and Harrison, C. 2005. “Combinatorial and high-throughput measurements of thin film modulus.” Rev. Sci. Instrum., 76(6), 062207.
C. M. Stafford, C. Harrison, in Encyclopedia of Materials: Science and Technology (Online Updates), (Eds: K. H. Jürgen Buschow, R. W. Cahn, M. C. Flemings, B. Ilschner, E. J. Kramer, S. Mahajan, P. Veyssière), Elsevier, 2006, 1.
Rui Huang, Christopher M. Stafford and Bryan D. Vogt, “Wrinkling of ultrathin polymer films”, Materials Research Society Symp. Proc. Vol. 924, 2006, Paper 0924-Z04-10
Wilder, E. A. , Guo, S. , Sheng, L. G. , And, M. J. F. , and Stafford, C. M. , 2006, “Measuring the Modulus of Soft Polymer Networks Via a Buckling-Based Metrology,” Macromolecules, 39(12), pp. 4138–4143.
Stafford, C. M., Vogt, B. D., Harrison, C., Julthongpiput, D., and Huang, R. (2006). “Elastic moduli of ultrathin amorphous polymer films.” Macromolecules, 39(15), 5095–5099
Mei, H. , Huang, R. , Chung, J. Y. , and Stafford, C. M. , 2007, “Buckling Modes of Elastic Thin Films on Elastic Substrates,” Appl. Phys. Lett., 90(15), p. 151902.
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