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Fig. 15. Global–local-coupling instability phenomenon of sandwich beam III.

FROM:
Yin Liu (1), Kun Yu (1), Heng Hu (1), Salim Belouettar (2), Michel Potier-Ferry (2) and Noureddine Damil (4)
(1) School of Civil Engineering, Wuhan University, 8 South Road of East Lake, Wuchang, 430072 Wuhan, PR China
(2) Centre de Recherche Public Henri Tudor, 29, avenue John F. Kennedy, L-1855 Luxembourg-Kirchberg, Luxembourg
(3) Laboratoire d’Etude des Microstructures et de Mécanique des Matériaux, LEM3, UMR CNRS 7239, Université de Lorraine, Ile du Saulcy, 57045 Metz Cedex 01, France
(4) Laboratoire de Calcul Scientifique en Mécanique, Faculté des Sciences Ben M’Sik, Université Hassan II Mohammedia-Casablanca, Sidi Othman, Casablanca, Morocco

“A new Fourier-related double scale analysis for instability phenomena in sandwich structures”, International Journal of Solids and Structures, Vol. 49, No. 22, pp 3077-3088, November 2012, https://doi.org/10.1016/j.ijsolstr.2012.06.005

ABSTRACT: In this paper, we present a new Fourier-related double scale analysis to study instability phenomena of sandwich structures. By using the technique of slowly variable Fourier coefficients, a zig–zag theory based microscopical sandwich model is transformed into a macroscopical one that offers three numerical advantages. Firstly, only the envelopes of instability patterns are evaluated and this leads to a significant improvement on computational efficiency, especially when dealing with high wavenumber wrinkling phenomena. Secondly, the proposed macroscopical model allows one to select modal wavelength, which makes easy to control non-linear calculations. Thirdly, in contrast to Landau–Ginzburg envelope equations, it may also remain valid away from the bifurcation point and the coupling between global and local instabilities can be accounted for. The established non-linear system is solved by asymptotic numerical method (ANM), which is more reliable and less time consuming than other iterative classical methods. The proposed double scale analysis yields accurate results with a significant reduced computational cost.

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