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FROM:
Li, B., Huang, S.Q., Feng, X.Q., 2010. Buckling and postbuckling of a compressed thin film bonded on a soft elastic layer: a three-dimensional analysis. Arch. Appl. Mech. 80, 175–188, DOI: 10.1007/s00419-009-0313-2
ABSTRACT: The wrinkling of a stiff thin film bonded on a soft elastic layer and subjected to an applied or residual compressive stress is investigated in the present paper. A three-dimensional theoretical model is presented to predict the buckling and postbuckling behavior of the film. We obtained the analytical solutions for the critical buckling condition and the postbuckling morphology of the film. The effects of the thicknesses and elastic properties of the film and the soft layer on the characteristic wrinkling wavelength are examined. It is found that the critical wrinkling condition of the thin film is sensitive to the compressibility and thickness of the soft layer, and its wrinkling amplitude depends on the magnitude of the applied or residual in-plane stress. The bonding condition between the soft layer and the rigid substrate has a considerable influence on the buckling of the thin film, and the relative sliding at the interface tends to destabilize the system.
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