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From:
Fan Xu (1,2), Michel Potier-Ferry (2), Salim Belouettar (1) and Heng Hu (3)
(1) Centre de Recherche Public Henri Tudor, 29 Avenue John F. Kennedy, L-1855 Luxembourg-Kirchberg, Luxembourg
(2) Laboratoire d׳Etude des Microstructures et de Mécanique des Matériaux, LEM3, UMR CNRS 7239, Université de Lorraine, Ile du Saulcy, 57045 Metz Cedex 01, France
(3) School of Civil Engineering, Wuhan University, 8 South Road of East Lake, 430072 Wuhan, PR China
“Multiple bifurcations in wrinkling analysis of thin films on compliant substrates”, International Journal of Non-Linear Mechanics, Vol. 76, pp 203-222, November 2015, https://doi.org/10.1016/j.ijnonlinmec.2014.12.006
ABSTRACT: Wrinkling phenomena of stiff thin films on compliant substrates are investigated based on a non-linear finite element model. The resulting non-linear equations are then solved by the Asymptotic Numerical Method (ANM) that gives interactive access to semi-analytical equilibrium branches, which offers considerable advantage of reliability compared with classical iterative algorithms. Bifurcation points are detected through computing bifurcation indicators well adapted to the ANM. The effect of boundary conditions and material properties of the substrate on the bifurcation portrait is carefully studied. The evolution of wrinkling patterns and post-bifurcation modes including period-doubling has been observed beyond the onset of the primary sinusoidal wrinkling mode in the post-buckling range.
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