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| Wrinkle/ridge transitions in thin film/substrate systems |
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| Pre-wrinkled states (a,b,c) of the film/substrate system; (d) wrinked state; (e) state after the wrinkle-to-ridge transition |
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| Strain-normal-deformation curve of the film at the location of the ridge peak during its 4 phases of wrinkle-to-ridge transition |
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| Formation of a ridge in a test specimen |
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| A process by which wrinkles can form in a thin film bonded to a pre-strained compliant substrate |
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| Wrinkling, necking, cracking, and pulverization of thin film anode on stiff and compliant substrates under cyclic loading |
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| Stiff film on compliant substrate: buckling and post-buckling under uniform compression in the x-direction |
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| Surface wrinkling of a compressed functionally graded layer |
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| Film-substrate under uniform tension: (1)Prebuckling, (b) initial buckling, (c) early postbuckling, (d) later postbuckling |
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| Biofilm wrinkling from differential growth as a function of circumferential and radial strain |
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| Graphene ripple followed by tall wrinkle followed by folded wrinkle |
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| Wrinkles followed by large folds in axially compressed thin film on compliant substrate |
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| Axially compressed thin film on a compliant substrate: The development of post-wrinkling symmetric and antisymmetric deep folds |
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| Load-deflection curves for 2 axially compressed thick, imperfect, clamped columns, one transversely stiff and the other transversely soft |
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| Deformation of the axially compressed, imperfect thick column at points A,B,D,E on the load-deflection curve corresponding to the transversely soft material (Ezz/Exx=0 |
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